Fairmat 2025: adding SPM to contributed definitions #1589
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Co-authored-by: Lukas Pielsticker <[email protected]> Co-authored-by: markus.kuehbach <[email protected]> Co-authored-by: Markus Kühbach <[email protected]> Co-authored-by: RubelMozumder <[email protected]> Co-authored-by: Rubel <[email protected]>
Co-authored-by: domna <[email protected]> Co-authored-by: Florian Dobener <[email protected]> Co-authored-by: kuehbachm <[email protected]> Co-authored-by: Lukas Pielsticker <[email protected]> Co-authored-by: markus.kuehbach <[email protected]> Co-authored-by: Markus Kühbach <[email protected]> Co-authored-by: mkuehbach <[email protected]> Co-authored-by: Pete R Jemian <[email protected]> Co-authored-by: RubelMozumder <[email protected]> Co-authored-by: RubelMozumder <[email protected]> Co-authored-by: Rubel <[email protected]>
Co-authored-by: Florian Dobener <[email protected]> Co-authored-by: Lukas Pielsticker <[email protected]> Co-authored-by: markus.kuehbach <[email protected]> Co-authored-by: Pete R Jemian <[email protected]> Co-authored-by: RubelMozumder <[email protected]> Co-authored-by: Sherjeel Shabih <[email protected]>
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NXspmprovides a shared structural framework for capturing essential components such as the instrument configuration, experimental, and sample environments, scan data acquired during measurements, and other relevant metadata for experiments like scanning tunneling microscopy (STM), scanning tunneling spectroscopy (STS), and atomic force microscopy (AFM).This proposal has several new application definitions:
NXspmNXstmNXstsNXafmas well as a set of new base classes for these experiments:
NXlockinNXspm_bias_spectroscopyNXspm_cantileverNXspm_cantilever_configNXspm_cantilever_oscillator:NXphase_lock_loop:NXspm_piezo_configNXspm_piezoelectric_materialNXspm_positionerNXspm_scan_controlNXspm_scan_patternNXspm_scan_regionNXspm_temperature_sensorThis is currently planned for the contributed definitions and the NXDL 2026 milestone.